Local current measurements
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F18%3A00511240" target="_blank" >RIV/68378271:_____/18:00511240 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/B978-0-12-813347-7.00010-8" target="_blank" >http://dx.doi.org/10.1016/B978-0-12-813347-7.00010-8</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/B978-0-12-813347-7.00010-8" target="_blank" >10.1016/B978-0-12-813347-7.00010-8</a>
Alternative languages
Result language
angličtina
Original language name
Local current measurements
Original language description
Method of local electric current measurements by an Atomic Force Microscope are presented and described in order to evaluate the measured data quantitatively.
Czech name
—
Czech description
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Classification
Type
C - Chapter in a specialist book
CEP classification
—
OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology
ISBN
978-0-12-813347-7
Number of pages of the result
37
Pages from-to
265-301
Number of pages of the book
416
Publisher name
Elsevier
Place of publication
Amsterdam
UT code for WoS chapter
000463376600011