A comparison of LIDT behavior of AR-coated yttrium-aluminium-garnet substrates with respect to thin-film design and coating technology

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F18%3A00542382" target="_blank" >RIV/68378271:_____/18:00542382 - isvavai.cz</a>
Result on the web
<a href="https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10805/2500189/A-comparison-of-LIDT-behavior-of-AR-coated-yttrium-aluminium/10.1117/12.2500189.short" target="_blank" >https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10805/2500189/A-comparison-of-LIDT-behavior-of-AR-coated-yttrium-aluminium/10.1117/12.2500189.short</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2500189" target="_blank" >10.1117/12.2500189</a>

Result language
angličtina
Original language name
A comparison of LIDT behavior of AR-coated yttrium-aluminium-garnet substrates with respect to thin-film design and coating technology
Original language description
Several sets of polished substrates were manufactured from monocrystalline yttrium-aluminium-garnet (YAG) grown by the Czochralski method. Samples were coated by both narrow-band and broad-band dielectric anti-reflection (AR) thin-film system prepared using either reactive or ion-assisted e-beam deposition technology and tested for laser-induced damage threshold (LIDT) at 1030 nm 10 ns in s-on-1 mode according to the ISO 21254 standard. Measured damage thresholds at normal (0 deg) incidence were compared for different thin-film designs and coating technology.
Czech name
—
Czech description
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Project
<a href="/en/project/TH02010579" target="_blank" >TH02010579: Stable thin films for optical and monocrystalline materials</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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