Transient dielectric functions of Ge, Si, and InP from femtosecond pump-probe ellipsometry
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F19%3A00521463" target="_blank" >RIV/68378271:_____/19:00521463 - isvavai.cz</a>
Result on the web
<a href="http://hdl.handle.net/11104/0306082" target="_blank" >http://hdl.handle.net/11104/0306082</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.5109927" target="_blank" >10.1063/1.5109927</a>
Alternative languages
Result language
angličtina
Original language name
Transient dielectric functions of Ge, Si, and InP from femtosecond pump-probe ellipsometry
Original language description
Transient dielectric functions with a 120 fs time resolution of Ge, Si, and InP were acquired from 1.7 to 3.5eV with a femtosecond pump-probe rotating-compensator ellipsometer. The intensity of the pump laser (with 1.55, 3.10, or 4.65eV photon energy) was adjusted to create an initial near-surface carrier density of 10(20)cm(-3). In Ge, there is a significant (similar to 15%) decrease in the E-1 and E-1+Delta(1) critical point absorption and a Kramers-Kronig consistent change in the refractive index because photoexcited electrons at L block these transitions and reduce their amplitudes. Only a small redshift of the E-1 critical point is observed, which we attribute to lattice heating and exchange-correlation effects. Minimal changes were found for Si and InP, where electrons near Delta and Gamma do not participate in interband transitions between 1.7 and 3.5eV.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)
Result continuities
Project
<a href="/en/project/LQ1606" target="_blank" >LQ1606: ELI Beamlines: International Center of Excelence</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Physics Letters
ISSN
0003-6951
e-ISSN
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Volume of the periodical
115
Issue of the periodical within the volume
5
Country of publishing house
US - UNITED STATES
Number of pages
4
Pages from-to
1-4
UT code for WoS article
000478913700025
EID of the result in the Scopus database
2-s2.0-85073886140