Optical characterization of low temperature amorphous MoOx, WOX, and VOx prepared by pulsed laser deposition

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00525041" target="_blank" >RIV/68378271:_____/20:00525041 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21230/20:00335858 RIV/00216208:11320/20:10402235
Result on the web
<a href="https://doi.org/10.1016/j.tsf.2019.137690" target="_blank" >https://doi.org/10.1016/j.tsf.2019.137690</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2019.137690" target="_blank" >10.1016/j.tsf.2019.137690</a>

Result language
angličtina
Original language name
Optical characterization of low temperature amorphous MoOx, WOX, and VOx prepared by pulsed laser deposition
Original language description
Thin films of amorphous transition metal oxides of Mo, W, V and Zn were prepared by pulsed laser deposition, and their optical properties and work function were determined. From the gradient of the absorption edge, Urbach energy was obtained, evaluating disorder in the semiconductor material. The work function of each material was obtained by Kelvin probe, and a slight correlation with Urbach energy was found. X-ray photoelectron spectroscopy indicated successful stochiometric transfer mainly for the lowest pressure and highest temperature samples.n
Czech name
—
Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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