X-ray pulse stretching after diffraction
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00539016" target="_blank" >RIV/68378271:_____/20:00539016 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1107/S1600576720003714" target="_blank" >https://doi.org/10.1107/S1600576720003714</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S1600576720003714" target="_blank" >10.1107/S1600576720003714</a>
Alternative languages
Result language
angličtina
Original language name
X-ray pulse stretching after diffraction
Original language description
The development of ultra-short X-ray pulse sources requires an optics that keeps the pulse length as short as possible. One source of pulse stretching is the penetration of the pulse into a crystal during diffraction. Another source is the inclination of the intensity front when the diffraction is asymmetric. Currently, the theory of short X-ray pulses diffraction is well developed by many authors. As it is rather complicated, it is sometimes difficult to foresee the pulse behavior (mainly stretching) during diffraction on various crystal arrangements. In this paper, a simple model is suggested that gives a qualitatively similar shape of the diffracted pulse which follows from exact theory. It allows proposing what experimental arrangement is optimal to minimize the pulse stretching during diffraction. The effect of pulse stretching due to penetration into a crystal surface is studied. On basis of this, the pulse profile change during the diffraction on two crystals, is predicted.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Applied Crystallography
ISSN
0021-8898
e-ISSN
1600-5767
Volume of the periodical
53
Issue of the periodical within the volume
June
Country of publishing house
GB - UNITED KINGDOM
Number of pages
6
Pages from-to
623-628
UT code for WoS article
000537556900004
EID of the result in the Scopus database
2-s2.0-85096897713