XPS as an advanced method for analysis of organic materials

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00540756" target="_blank" >RIV/68378271:_____/20:00540756 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
XPS as an advanced method for analysis of organic materials
Original language description
XPS is known as a surface-sensitive method that allows us to obtain quantitative information about the chemical composition of organic materials. Here we present technological challenges in XPS analysis of AAs and cells (geobacter, Algae). The first part focuses on an understanding of the actual mechanisms of AAs interaction with H-/O-terminated NCD and DLC films using XPS. The detailed processing of XPS data revealed the dependence of AAs adhesion on the surface termination of carbon-based materials. The second part focuses on the investigation of intact interfaces of centrifuged wet pastes of geobacter and Algae followed by XPS at liquid nitrogen temperatures. The detailed XPS analysis of C 1s, O 1s, N 1s and S 2p peaks was discussed. This work was supported by project ESIF and MEYS (Project “FZU- researchers, technical and administrative staff mobility” – CZ.02.2.69/0.0/0.0/18_053/0016627), by project VEGA 1/0554/20 and by the Czech Science Foundation (project No. 20-00925Y).
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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