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Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00568882" target="_blank" >RIV/68378271:_____/20:00568882 - isvavai.cz</a>

  • Result on the web

    <a href="https://hdl.handle.net/11104/0340160" target="_blank" >https://hdl.handle.net/11104/0340160</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.tsf.2022.139580" target="_blank" >10.1016/j.tsf.2022.139580</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry

  • Original language description

    This paper discusses the fundamentals, applications, potential and limitations of polarized light reflection techniques for the characterization of phase-change materials (PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the ca-pabilities of spectroscopic ellipsometry in the determination of the extinction coefficient of PCMs and the ca-pabilities of imaging ellipsometry to characterize PCMs. We show that ellipsometry is capable of more than the determination of thickness and optical properties, and it can be exploited to gain information about crystalli-zation/amorphization kinetics and mapping anisotropies.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10303 - Particles and field physics

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Thin Solid Films

  • ISSN

    0040-6090

  • e-ISSN

    1879-2731

  • Volume of the periodical

    763

  • Issue of the periodical within the volume

    DEC

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    10

  • Pages from-to

    139580

  • UT code for WoS article

    000886765500007

  • EID of the result in the Scopus database

    2-s2.0-85141530202