Damage kinetics induced by swift heavy ion impacts onto films of different thicknesses

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F21%3A00545325" target="_blank" >RIV/68378271:_____/21:00545325 - isvavai.cz</a>
Alternative codes found
RIV/61389021:_____/21:00579879
Result on the web
<a href="https://doi.org/10.1016/j.apsusc.2021.150640" target="_blank" >https://doi.org/10.1016/j.apsusc.2021.150640</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2021.150640" target="_blank" >10.1016/j.apsusc.2021.150640</a>

Result language
angličtina
Original language name
Damage kinetics induced by swift heavy ion impacts onto films of different thicknesses
Original language description
Response of CaF2 thin films to swift heavy ions irradiation is studied with Monte-Carlo code TREKIS and mo lecular dynamics simulations. Two factors affecting the damage kinetics in ion tracks in films of different thickness are considered: electron emission and an effect of the layer thickness. It is shown that escape of electrons from the target surface is important in films thinner than 15 nm and can significantly reduce energy deposited into the lattice. Three different modes of damage realize depending on the layer thickness: a through hole forms in the thinnest layers despite energy loss via electron emission, semispherical and spherical hillocks form at intermediate thicknesses, emission of nanoclusters occurs from thick layers.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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