Bismuth layer properties in the ultrathin Bi–FeNi multilayer films probed by spectroscopic ellipsometry

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F21%3A00547875" target="_blank" >RIV/68378271:_____/21:00547875 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1063/5.0069691" target="_blank" >https://doi.org/10.1063/5.0069691</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/5.0069691" target="_blank" >10.1063/5.0069691</a>

Result language
angličtina
Original language name
Bismuth layer properties in the ultrathin Bi–FeNi multilayer films probed by spectroscopic ellipsometry
Original language description
Using wideband (0.5–6.5 eV) spectroscopic ellipsometry, we study ultrathin [Bi(0.6–2.5 nm)–FeNi(0.8,1.2 nm)]N multilayer films grown by rf sputtering deposition, where the FeNi layer has a nanoisland structure and its morphology and magnetic properties change with decreasing the nominal layer thickness. From multilayer model simulations of the ellipsometric angles, WðxÞ and DðxÞ, complex (pseudo)dielectric function spectra of the Bi layer were extracted. The obtained results demonstrate that the Bi layer can possess the surface metallic conductivity, which is strongly affected by the morphology and magnetic properties of the nanoisland FeNi layer in GMR-type Bi–FeNi multilayer structures.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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