Image analysis algorithm for the verification of hexagonal symmetry in spherical nanostructures
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00556001" target="_blank" >RIV/68378271:_____/22:00556001 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21110/22:00356656
Result on the web
<a href="https://doi.org/10.1016/j.mee.2021.111635" target="_blank" >https://doi.org/10.1016/j.mee.2021.111635</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.mee.2021.111635" target="_blank" >10.1016/j.mee.2021.111635</a>
Alternative languages
Result language
angličtina
Original language name
Image analysis algorithm for the verification of hexagonal symmetry in spherical nanostructures
Original language description
Verification of ordering and symmetry is essential to enhance the nanofabrication process of periodic nano-structures. In this paper, we present the open-source software HEXI, which can detect circles and distinguish between perfect hexagonal ordering and defect configurations. The proposed user-friendly image analysis soft-ware (implemented in Python) consists of several stages. First, the algorithm identifies circular structures in microscopy (e.g., scanning electron microscopy, atomic force microscopy) images using the Canny edge detector and the Hough circle transform. Then, the detected circles are categorized as hexagonally ordered or non- hexagonally ordered (defects). This classification can be achieved using three different methods: variance in brightness (global or adaptive) and distance.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronic Engineering
ISSN
0167-9317
e-ISSN
1873-5568
Volume of the periodical
251
Issue of the periodical within the volume
Jan
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
10
Pages from-to
111635
UT code for WoS article
000710177300002
EID of the result in the Scopus database
2-s2.0-85118727388