Effect of substrate and thickness on the photoconductivity of nanoparticle titanium dioxide thin film vacuum ultraviolet photoconductive detector
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00556005" target="_blank" >RIV/68378271:_____/22:00556005 - isvavai.cz</a>
Result on the web
<a href="http://hdl.handle.net/11104/0330370" target="_blank" >http://hdl.handle.net/11104/0330370</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/nano12010010" target="_blank" >10.3390/nano12010010</a>
Alternative languages
Result language
angličtina
Original language name
Effect of substrate and thickness on the photoconductivity of nanoparticle titanium dioxide thin film vacuum ultraviolet photoconductive detector
Original language description
Vacuum ultraviolet radiation (VUV, from 100 nm to 200 nm wavelength) is indispensable in many applications, but its detection is still challenging. We report the development of a VUV photoconductive detector, based on titanium dioxide (TiO2) nanoparticle thin films. The effect of crystallinity, optical quality, and crystallite size due to film thickness (80 nm, 500 nm, 1000 nm) and type of substrate (silicon Si, quartz SiO2, soda-lime glass SLG) was investigated to explore ways of enhancing the photoconductivity of the detector. The TiO2 film deposited on SiO2 substrate with a film thickness of 80 nm exhibited the best photoconductivity, with a photocurrent of 5.35 milli-Amperes and a photosensitivity of 99.99% for a bias voltage of 70 V. The wavelength response of the detector can be adjusted by changing the thickness of the film as the cut-off shifts to a longer wavelength, as the film becomes thicker. The response time of the TiO2 detector is about 5.8 μs and is comparable to the 5.4 μs response time of a diamond UV sensor. The development of the TiO2 nanoparticle thin film detector is expected to contribute to the enhancement of the use of VUV radiation in an increasing number of important technological and scientific applications.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/FV20580" target="_blank" >FV20580: Planar optical structures and security elements based on multilayer systems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nanomaterials
ISSN
2079-4991
e-ISSN
2079-4991
Volume of the periodical
12
Issue of the periodical within the volume
1
Country of publishing house
CH - SWITZERLAND
Number of pages
13
Pages from-to
10
UT code for WoS article
000741743500001
EID of the result in the Scopus database
2-s2.0-85121376669