Dual-wavelength femtosecond laser-induced low-fluence single-shot damage and ablation of silicon
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F24%3A00587560" target="_blank" >RIV/68378271:_____/24:00587560 - isvavai.cz</a>
Result on the web
<a href="https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12939/129390F/Dual-wavelength-femtosecond-laser-induced-low-fluence-single-shot-damage/10.1117/12.3012585.short" target="_blank" >https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12939/129390F/Dual-wavelength-femtosecond-laser-induced-low-fluence-single-shot-damage/10.1117/12.3012585.short</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.3012585" target="_blank" >10.1117/12.3012585</a>
Alternative languages
Result language
angličtina
Original language name
Dual-wavelength femtosecond laser-induced low-fluence single-shot damage and ablation of silicon
Original language description
A study of damage and ablation of silicon induced by two individual femtosecond laser pulses of different wavelengths, 1030 and 515 nm, is performed to address the physical mechanisms of dual-wavelength ablation and reveal possibilities for increasing the ablation efficiency. The produced ablation craters and damaged areas are analyzed as a function of time separation between the pulses and are compared with monochromatic pulses of the same total energy. Particular attention is given to low-fluence irradiation regimes when the energy densities in each pulse are below the ablation threshold and thus no shielding of the subsequent pulse by the ablation products occurs. The sequence order of pulses is demonstrated to be essential in bi-color ablation with higher material removal rates when a shorter-wavelength pulse arrives first at the surface. At long delays of 30-100 ps, the dual-wavelength ablation is found to be particularly strong with the formation of deep smooth craters. This is explained by the expansion of a hot liquid layer produced by the first pulse with a drastic decrease in the surface reflectivity at this timescale. The results provide insight into the processes of dual-wavelength laser ablation offering a better control of the energy deposition into material.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
<a href="/en/project/EH22_008%2F0004596" target="_blank" >EH22_008/0004596: Sensors and Detectors for Future Information Society</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SPIE - The International Society for Optical Engineering
ISBN
978-151067184-3
ISSN
0277-786X
e-ISSN
—
Number of pages
8
Pages from-to
129390F
Publisher name
SPIE
Place of publication
Bellingham
Event location
Santa Fe
Event date
Feb 26, 2024
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
001260005400014