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Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00619295" target="_blank" >RIV/68378271:_____/25:00619295 - isvavai.cz</a>

  • Alternative codes found

    RIV/61389021:_____/25:00619295 RIV/46747885:24220/25:00012767

  • Result on the web

    <a href="https://opg.optica.org/ol/fulltext.cfm?uri=ol-50-6-1885&id=568913" target="_blank" >https://opg.optica.org/ol/fulltext.cfm?uri=ol-50-6-1885&id=568913</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1364/OL.553380" target="_blank" >10.1364/OL.553380</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy

  • Original language description

    Optical coating, an integral part of many optical systems, is prone to damage from environmental exposure and laser irradiation. This underscores the need for reliable and sensitive coating diagnostics. We introduce second harmonic generation (SHG) as a method for the sensitive detection of defects and inhomogeneities within optical thin films. We demonstrate the use of SHG on Si3N4 layers tested for their laser-induced damage threshold. The SHG mapping was compared with commonly used diagnostic techniques, including Nomarski microscopy, white light interferometry, and electron microscopy. Owing to its sensitivity to variations in local symmetry, SHG is able to discern minute alterations in material composition, mechanical stress, and interface structures. Therefore, SHG identified modifications in the tested layers, highly extending the damage recognized by standard methods. Furthermore, we demonstrate SHG’s ability to enhance specific features by modulation of incidence angles and polarization modes. Based on these findings, we propose SHG as an ideal diagnostic tool for the early identification of laser-induced modifications in centrosymmetric thin films.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10305 - Fluids and plasma physics (including surface physics)

Result continuities

  • Project

    <a href="/en/project/EH22_008%2F0004573" target="_blank" >EH22_008/0004573: Breakthrough Laser Technologies for Smart Manufacturing, Space and Bio-Tech Applications</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Optics Letters

  • ISSN

    0146-9592

  • e-ISSN

    1539-4794

  • Volume of the periodical

    50

  • Issue of the periodical within the volume

    6

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    4

  • Pages from-to

    1885-1888

  • UT code for WoS article

    001466470000001

  • EID of the result in the Scopus database

    2-s2.0-105000238055