Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00619295" target="_blank" >RIV/68378271:_____/25:00619295 - isvavai.cz</a>
Alternative codes found
RIV/61389021:_____/25:00619295 RIV/46747885:24220/25:00012767
Result on the web
<a href="https://opg.optica.org/ol/fulltext.cfm?uri=ol-50-6-1885&id=568913" target="_blank" >https://opg.optica.org/ol/fulltext.cfm?uri=ol-50-6-1885&id=568913</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OL.553380" target="_blank" >10.1364/OL.553380</a>
Alternative languages
Result language
angličtina
Original language name
Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy
Original language description
Optical coating, an integral part of many optical systems, is prone to damage from environmental exposure and laser irradiation. This underscores the need for reliable and sensitive coating diagnostics. We introduce second harmonic generation (SHG) as a method for the sensitive detection of defects and inhomogeneities within optical thin films. We demonstrate the use of SHG on Si3N4 layers tested for their laser-induced damage threshold. The SHG mapping was compared with commonly used diagnostic techniques, including Nomarski microscopy, white light interferometry, and electron microscopy. Owing to its sensitivity to variations in local symmetry, SHG is able to discern minute alterations in material composition, mechanical stress, and interface structures. Therefore, SHG identified modifications in the tested layers, highly extending the damage recognized by standard methods. Furthermore, we demonstrate SHG’s ability to enhance specific features by modulation of incidence angles and polarization modes. Based on these findings, we propose SHG as an ideal diagnostic tool for the early identification of laser-induced modifications in centrosymmetric thin films.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)
Result continuities
Project
<a href="/en/project/EH22_008%2F0004573" target="_blank" >EH22_008/0004573: Breakthrough Laser Technologies for Smart Manufacturing, Space and Bio-Tech Applications</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Optics Letters
ISSN
0146-9592
e-ISSN
1539-4794
Volume of the periodical
50
Issue of the periodical within the volume
6
Country of publishing house
US - UNITED STATES
Number of pages
4
Pages from-to
1885-1888
UT code for WoS article
001466470000001
EID of the result in the Scopus database
2-s2.0-105000238055