Simulation of Susceptibility of Phase Evaluation Algorithms in Electro-Optic Holography to Systematic and Random Errors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F02%3A01075690" target="_blank" >RIV/68407700:21110/02:01075690 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Simulation of Susceptibility of Phase Evaluation Algorithms in Electro-Optic Holography to Systematic and Random Errors

Original language description

In the presented work there were proposed several evaluation algorithms and a complex analysis of the measurement process was performed. There were considered many factors that can affect the final accuracy of the measurement. Some important potential error sources were chosen and these influences were implemented in the model of the phase evaluation process. The properties of different evaluation multi-frame algorithms have been also investigated and the algorithms were compared with respect to their accuracy and sensitivity to the described types of errors

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

<a href="/en/project/GA103%2F02%2F0357" target="_blank" >GA103/02/0357: Modern optoelectronic methods of measuring surfaces´topography</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2002

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Photon 02: Abstract Book and Programme

ISBN

0-7503-0916-4

ISSN

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e-ISSN

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Number of pages

1

Pages from-to

75-75

Publisher name

Institute of Physics

Place of publication

London

Event location

Cardiff

Event date

Sep 2, 2002

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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