New Optoelectronic Methods for Testing Optical Systems
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F06%3A01119497" target="_blank" >RIV/68407700:21110/06:01119497 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
New Optoelectronic Methods for Testing Optical Systems
Original language description
This work describes proposed methods for control of optical surfaces quality and optical systems testing
Czech name
New Optoelectronic Methods for Testing Optical Systems
Czech description
V práci jsou popsány navržené metody pro kontrolu tvaru optických ploch a kontrolu kvality optických soustav
Classification
Type
D - Article in proceedings
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
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Continuities
V - Vyzkumna aktivita podporovana z jinych verejnych zdroju
Others
Publication year
2006
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of Workshop 2006
ISBN
80-01-03439-9
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
ČVUT
Place of publication
Praha
Event location
Praha
Event date
Feb 20, 2006
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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