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Analysis of Seidel aberration coefficients of thick lens with arbitrary focal length

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F18%3A00322103" target="_blank" >RIV/68407700:21110/18:00322103 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1117/12.2313321" target="_blank" >http://dx.doi.org/10.1117/12.2313321</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1117/12.2313321" target="_blank" >10.1117/12.2313321</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Analysis of Seidel aberration coefficients of thick lens with arbitrary focal length

  • Original language description

    The third-order aberration (Seidel) coefficients for a thick lens in air with arbitrary focal length are derived and the explicit analytic dependence of individual aberration coefficients on the lens thickness is presented. Such formulas make possible to analyze an influence of the lens thickness on lens aberration properties and the replacement of a thick lens optical system by a thin lens model. Equations are described for the recalculation of aberration coefficients for a different value of focal length and a different value of entrance pupil position. The presented formulas have a fundamental importance for the optical design of optical systems consisting several thick lenses, because these formulas show the influence of the thickness of individual lenses on aberrations of the whole optical system. Furthermore, the thickness of individual lenses can be analytically calculated in order the lens had a required value of specific aberration. The designed optical system then may serve as an initial system for further optimization using optical design software.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Optical Design and Engineering VII

  • ISBN

    978-1-5106-1917-3

  • ISSN

    0277-786X

  • e-ISSN

    1996-756X

  • Number of pages

    7

  • Pages from-to

  • Publisher name

    SPIE

  • Place of publication

    Bellingham (stát Washington)

  • Event location

    Frankfurt am Main

  • Event date

    May 14, 2018

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000453782200069