Analysis of Seidel aberration coefficients of thick lens with arbitrary focal length
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F18%3A00322103" target="_blank" >RIV/68407700:21110/18:00322103 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2313321" target="_blank" >http://dx.doi.org/10.1117/12.2313321</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2313321" target="_blank" >10.1117/12.2313321</a>
Alternative languages
Result language
angličtina
Original language name
Analysis of Seidel aberration coefficients of thick lens with arbitrary focal length
Original language description
The third-order aberration (Seidel) coefficients for a thick lens in air with arbitrary focal length are derived and the explicit analytic dependence of individual aberration coefficients on the lens thickness is presented. Such formulas make possible to analyze an influence of the lens thickness on lens aberration properties and the replacement of a thick lens optical system by a thin lens model. Equations are described for the recalculation of aberration coefficients for a different value of focal length and a different value of entrance pupil position. The presented formulas have a fundamental importance for the optical design of optical systems consisting several thick lenses, because these formulas show the influence of the thickness of individual lenses on aberrations of the whole optical system. Furthermore, the thickness of individual lenses can be analytically calculated in order the lens had a required value of specific aberration. The designed optical system then may serve as an initial system for further optimization using optical design software.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Optical Design and Engineering VII
ISBN
978-1-5106-1917-3
ISSN
0277-786X
e-ISSN
1996-756X
Number of pages
7
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham (stát Washington)
Event location
Frankfurt am Main
Event date
May 14, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000453782200069