Radiation hardness of semiconductor single photon detection structure
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21220%2F19%3A00334289" target="_blank" >RIV/68407700:21220/19:00334289 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21340/19:00334289
Result on the web
<a href="http://dx.doi.org/10.1117/12.2521042" target="_blank" >http://dx.doi.org/10.1117/12.2521042</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2521042" target="_blank" >10.1117/12.2521042</a>
Alternative languages
Result language
angličtina
Original language name
Radiation hardness of semiconductor single photon detection structure
Original language description
The detection structure, it has been used in this experiment is employed for producing a single photon detector. The experiment was based on the analysis of changes in this low noise structure of a single photon detector in connection with its radiation damage in the event of neutron flux exposure. For the analysis of the radiation damaged structure was used the Zero Bias Thermally stimulated current method to explore the possibilities of filling traps with light sources. The filling of traps with photons emitted from LEDs or a flash device is compared on a neutron irradiated Si detector. The results of this experiment are used to increase the radiation hardness of manufactured single photon detection structures.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
10303 - Particles and field physics
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proc. SPIE 11027, Quantum Optics and Photon Counting 2019
ISBN
978-1-5106-2720-8
ISSN
0277-786X
e-ISSN
1996-756X
Number of pages
6
Pages from-to
—
Publisher name
SPIE
Place of publication
Bellingham (stát Washington)
Event location
Praha
Event date
Apr 1, 2019
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000502083100010