The Nonlinearity and Effect of Thick Film Rezistor Geometry
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F01%3A03073407" target="_blank" >RIV/68407700:21230/01:03073407 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
The Nonlinearity and Effect of Thick Film Rezistor Geometry
Original language description
Paper discuss the effect of variations in geometry on the nonlinearity of current-voltage characteristic of thick film resistors.
Czech name
Není k dispozici
Czech description
Není k dispozici
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Applied Electronics 2001
ISBN
80-7082-758-0
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
23-26
Publisher name
Západočeská universita
Place of publication
Plzeň
Event location
Pilsen
Event date
Sep 5, 2001
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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