Position Measurement Methods Using Opto-electronic Gate

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03089826" target="_blank" >RIV/68407700:21230/03:03089826 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Position Measurement Methods Using Opto-electronic Gate

Original language description

This paper presents principles of optical position measurement methods based on opto-electronic gate. The opto-electronic gate increases the resolution by using a CCD line sensor instead of a simple photo detector. The use of the CCD line sensor increases the range and precision of measurement. Two optical measurement methods will be introduced in this article. These methods were implemented and verified on developed opto-electronic gate. Basic principles of these methods, configuration of measuring set-up and main results will be described in this article. We will also introduce innovative and powerful concept of opto-electronic gate hardware construction.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Poster 2003

ISBN

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ISSN

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e-ISSN

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Number of pages

2

Pages from-to

"EI-40"-"EI-40"

Publisher name

ČVUT, Fakulta elektrotechnická

Place of publication

Praha

Event location

Prague

Event date

May 22, 2003

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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