Modeling and Simulation of Mechanical, Thermal and Electrical Behaviour of Si Cantilever with Implanted Strain Gauge
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03094252" target="_blank" >RIV/68407700:21230/03:03094252 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Modeling and Simulation of Mechanical, Thermal and Electrical Behaviour of Si Cantilever with Implanted Strain Gauge
Original language description
Not available
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F03%2F0619" target="_blank" >GA102/03/0619: Smart microsensors and microsystems for measurement, control and environment</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show
ISBN
0-9728422-0-9
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
448-451
Publisher name
Computationg Publications
Place of publication
Cambridge, M.A.
Event location
San Francisco
Event date
Feb 23, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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