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Measurement of RMS Values of Non-coherently Sampled Signals

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F04%3A03099817" target="_blank" >RIV/68407700:21230/04:03099817 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Measurement of RMS Values of Non-coherently Sampled Signals

  • Original language description

    If the RMS value is gained by digital processing of sequence of signal samples, both uncertainty and bias of the measured value depend on the algorithm used. Since in practice signal sampling is usually non-coherent, leakage occurs in signal DFT spectrumand definition of the RMS of periodic signals in time domain is violated. The paper compares three different DSP algorithms of RMS measurement by non-coherent sampling from the point of view of measurement bias and uncertainty for different algorithms and various leakage levels, ADC resolution, additive noise and data window used. Results of simulations and some measurements are evaluated both for monofrequency and multifrequency signals, and a new method of automatic RMS value bias correction will bepresented. Processing of digitized signal samples in time domain with two methods of signal processing in frequency domain are compared for the case of pure sinusoidal signals, and sinusoidal signal with additive noise.

  • Czech name

    Není k dispozici

  • Czech description

    Není k dispozici

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    13th International Symposium on Measurements for Research and Industry Applications

  • ISBN

    960-254-643-3

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    230-235

  • Publisher name

    IMEKO TC-4

  • Place of publication

    Athens

  • Event location

    Athens

  • Event date

    Sep 29, 2004

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article