Using Markov Models for Evaluation of Single Event Upset in TTP/C Systems

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F04%3A03102186" target="_blank" >RIV/68407700:21230/04:03102186 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Using Markov Models for Evaluation of Single Event Upset in TTP/C Systems
Original language description
This paper describes a general method of reliability evaluation for TTP/C based distributed systems. The method is based on Markov availability models that are designed and computed in a free visual tool called Sharpe. We assume transient single faults as required by the fault hypothesis of TTP/C but with exponential inter-arrival rate (necessary for Markov models), thus allowing occasionally for a rapid fault burst, i.e. a multiple fault. Multiple faults can cause system failure (crash) so the probability of failure increases in time. We evaluate this probability experimentally with different model parameters.
Czech name
Není k dispozici
Czech description
Není k dispozici

Project
<a href="/en/project/GA102%2F03%2F0672" target="_blank" >GA102/03/0672: Research of methods and tools for verification of embedded computer system fault tolerance</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of IFAC Workshop on Programmable Devices and Systems
ISBN
83-908409-8-7
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
100-104
Publisher name
Silesian Technical University
Place of publication
Gliwice
Event location
Krakow
Event date
Nov 18, 2004
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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