Measurement and Model Indentification of Semicoductor Devices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F05%3A03107848" target="_blank" >RIV/68407700:21230/05:03107848 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Measurement and Model Indentification of Semicoductor Devices
Original language description
In the paper, an optimization method is presented which is usable for identifications of even very complicated models with a relatively small number of iterations. The algorithm has been implemented into the original software tool called C.I.A. (CircuitInteractive Analyzer) into its static and dynamic analysis modes. Hence, the identification is able to identify both DC and capacitance models of semiconductor devices. The process is demonstrated in the paper using various transistors.
Czech name
Měření a identifikace modelů polovodičových prvků
Czech description
V článku je prezentována optimalizační metoda, která umožňuje identifikaci komplikovaných modelů prvků relativně malým počtem iterací. Algoritmus byl implementován v programu C.I.A. (Circuit Interactive Analyzer).
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
AEE´05 - Proceedings of the 4th WSEAS International Conference on: Applications of Electrical Engineering
ISBN
960-8457-13-0
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
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Publisher name
WSEAS Press
Place of publication
Athens
Event location
Praha
Event date
Mar 13, 2005
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
000230049300060