Extended Transfer Bound Error Analysis for Parametric Channel with Continuous Valued Correlated Random Nuisance Parameter

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F05%3A03110581" target="_blank" >RIV/68407700:21230/05:03110581 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Extended Transfer Bound Error Analysis for Parametric Channel with Continuous Valued Correlated Random Nuisance Parameter

Original language description

In this paper we address the extended use of transfer bound analysis of bit error rate (BER) properties. In conjunction with proper parameter modeling, we offer a method to resolve the problem of transfer bound applicability on a system with random and possibly correlated continuous valued nuisance parameters.

Czech name

Není k dispozici

Czech description

Není k dispozici

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2005

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Radioengineering

ISSN

1210-2512

e-ISSN

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Volume of the periodical

14

Issue of the periodical within the volume

3

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

8

Pages from-to

8-15

UT code for WoS article

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EID of the result in the Scopus database

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