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Refractivity Height Profile Estimations Based on Radiowave Refraction Simulations

Result description

The paper describes possibilities of refractive index height profile estimations using field measurement at a receiver site of a terrestrial point-to-point link in terms of angle-of-arrival (AOA) spectra. Several refractivity models based on orthogonal function set are introduced to improve the estimation accuracy.

Keywords

Electromagnetic propagation in nonhomogeneous mediaMillimeter wave radio propagationRefractivity estimation

The result's identifiers

Alternative languages

  • Result language

    angličtina

  • Original language name

    Refractivity Height Profile Estimations Based on Radiowave Refraction Simulations

  • Original language description

    The paper describes possibilities of refractive index height profile estimations using field measurement at a receiver site of a terrestrial point-to-point link in terms of angle-of-arrival (AOA) spectra. Several refractivity models based on orthogonal function set are introduced to improve the estimation accuracy.

  • Czech name

    Odhad výškového profilu refraktivity ze simulací rádiové refrakce

  • Czech description

    Příspěvek popisuje možnosti odhadu výškového profilu indexu lomu pomocí měřeného pole na přijímací straně spoje typu bod-bod v termínech úhlu dopadu. Jsou představeny modely profilu referaktivity založené na množině ortogonálních funkcí pro zlepšení přesnosti odhadu.

Classification

  • Type

    A - Audiovisual production

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • ISBN

  • Place of publication

    Brussels

  • Publisher/client name

  • Version

  • Carrier ID

    neuvedeno

Basic information

Result type

A - Audiovisual production

A

CEP

JA - Electronics and optoelectronics

Year of implementation

2005