Scan Based Circuits with Low Power Consumption
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F06%3A03120660" target="_blank" >RIV/68407700:21230/06:03120660 - isvavai.cz</a>
Alternative codes found
RIV/46747885:24220/06:#0000032 RIV/46747885:24220/06:@0000228
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scan Based Circuits with Low Power Consumption
Original language description
In this paper we present a low power scan design method. In order to maximize power savings and minimize the hardware overhead we have proposed a modified RAS diagnostic access method, which can be used together with the BS.
Czech name
Obvody se sériovým diagnostickým poístupem a sní3enou spotoebou
Czech description
Elánek popisuje novou diagnostickou metodu zalo3enou na principu RAS. Nová metoda umo3ouje sní3it spotoebu energie poi testování.
Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2006
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the IEEE East-West Design & Test International Workshop
ISBN
966-659-124-3
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
206-211
Publisher name
Kharkov Institute of Physics and Technology
Place of publication
Kharkov
Event location
Sochi
Event date
Sep 15, 2006
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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