Windowpane Detection based on Maximum Aposteriori Probability Labeling
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F08%3A00144353" target="_blank" >RIV/68407700:21230/08:00144353 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Windowpane Detection based on Maximum Aposteriori Probability Labeling
Original language description
Segmentation of windowpanes in images of building facades is formulated as a task of maximum aposteriori probability labeling. Assuming orthographic rectification of the image, the windowpanes are always axis-parallel rectangles of relatively low variability in appearance. Every image pixel has one of 10 possible labels, and the labels in adjacent pixels are constrained by allowed label configuration, such that the image labels represent a set of non-overlapping rectangles. The task of finding the mostprobable labeling of a given image leads to NP-hard discrete optimization problem. However, we find an approximate solution using a general solver suitable for such problems and we obtain promising results which we demonstrate on several experiments. Substantial difference between the presented paper and the state-of-the-art papers on segmentation based on Markov Random Fields is that we have a strong structure model, forcing the labels to form rectangles, while other methods do not mode
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JD - Use of computers, robotics and its application
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/1ET101210407" target="_blank" >1ET101210407: Multi-camera system for modeling and recognition of events</a><br>
Continuities
R - Projekt Ramcoveho programu EK
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Image Analysis - From Theory to Applications, Proceedings of the 12th International Workshop on Combinatorial Image Analysis (IWCIA'08)
ISBN
978-3-540-78274-2
ISSN
—
e-ISSN
—
Number of pages
9
Pages from-to
—
Publisher name
Research Publishing Services
Place of publication
Singapore
Event location
Buffalo
Event date
Apr 7, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—