High-Quality Low-Cost Low-Frequency Filter for ADC Testing
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F09%3A00157461" target="_blank" >RIV/68407700:21230/09:00157461 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
High-Quality Low-Cost Low-Frequency Filter for ADC Testing
Original language description
This paper deals with the generation of low-distortion sine wave signal by means of low-cost filter for the purpose of ADC testing at the signal frequency of 20 kHz. The design and manufacture of such a filter is proposed and the functionality of a prototype is verified on a top digitizer.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
XIX IMEKO World Congress 2009 - Fundamental and Applied Metrology
ISBN
978-963-88410-0-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
Instituto Superior Técnico/Instituto de Telecomunicaçoes Portugal
Place of publication
Lisbon
Event location
Lisabon
Event date
Sep 6, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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