Economical Test of Internal ADC in Embedded Systems

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F09%3A00157478" target="_blank" >RIV/68407700:21230/09:00157478 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Economical Test of Internal ADC in Embedded Systems
Original language description
This paper describes two methods for economical test of dynamic parameters ADCs in embedded Data Acquisition Systems. First method is Exponential Fit Test, second method is Wobbler Test. Common testing methods are mentioned as far the accuracy and time necessary for the complete test are concerned. The tests for fast evaluation of the dependence of an effective number of bits on frequency of input signal are described and the comparison of proposed method with the standard methods is given.
Czech name
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Czech description
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Project
<a href="/en/project/GD102%2F09%2FH082" target="_blank" >GD102/09/H082: Sensors and intelligent sensor systems</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
XIX IMEKO World Congress 2009 - Fundamental and Applied Metrology
ISBN
978-963-88410-0-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
Instituto Superior Técnico/Instituto de Telecomunicaçoes Portugal
Place of publication
Lisbon
Event location
Lisabon
Event date
Sep 6, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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