An often missed detail: Formula relating peek sensitivity with gain margin less than one
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F09%3A00158200" target="_blank" >RIV/68407700:21230/09:00158200 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
An often missed detail: Formula relating peek sensitivity with gain margin less than one
Original language description
An inequality relating gain margin with sensitivity peek value is presented in numberous basic control textbooks. In fact, this inequality fails to hold as soon as the open-loop Nyquist plot crosses the negative real axis on the left of the critical point. This opposite case is usually ignored by the textbook authors. A simple alternative inequality is derived in the paper to cover the not so popular opposite case. This fills a small gap one often encounters in basic control courses.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BC - Theory and management systems
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
17th International Conference on Process Control´09
ISBN
978-80-227-3081-5
ISSN
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e-ISSN
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Number of pages
8
Pages from-to
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Publisher name
Slovak University of Technology
Place of publication
Bratislava
Event location
Štrrbské Pleso
Event date
Jun 9, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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