Mathematically Simulated Process of Evaporation of Thin NiCr Films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F09%3A00161575" target="_blank" >RIV/68407700:21230/09:00161575 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Mathematically Simulated Process of Evaporation of Thin NiCr Films
Original language description
Process of evaporation of NiCr thin films has been simulated using DOE. Experiments of the type two to two have been carried out and mathematical model has been tested using F-test.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
15th International Symposium for Design and Technology of Electronics Packages
ISBN
978-1-4244-5132-6
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
106-107
Publisher name
TU Budapest
Place of publication
Budapest
Event location
Gyula
Event date
Sep 17, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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