A high resolution x-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F09%3A00162917" target="_blank" >RIV/68407700:21230/09:00162917 - isvavai.cz</a>
Alternative codes found
RIV/67985815:_____/09:00340052
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
A high resolution x-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings
Original language description
We present the design of a high resolution X-ray spectrometer for space based X-ray studies. This novel design utilizes a Kirkpatrick-Baez geometry with an off-plane grating as the secondary optic. This design has been proposed to NASA for flight onboarda suborbital rocket. The approach is low cost, low risk and has applications for future orbital missions.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
EUV and X-Ray Optics: Synergy between Laboratory and Space
ISBN
978-0-8194-7634-0
ISSN
0277-786X
e-ISSN
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Number of pages
10
Pages from-to
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Publisher name
SPIE
Place of publication
Bellingham
Event location
Praha
Event date
Apr 20, 2009
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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