Self Heating of an Atomic Force Microscope

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00163370" target="_blank" >RIV/68407700:21230/10:00163370 - isvavai.cz</a>

Alternative codes found

RIV/67985882:_____/10:00350712

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Self Heating of an Atomic Force Microscope

Original language description

Atomic force microscopy (AFM) is a sensitive technique susceptible to unwanted inluences, such as thermal noise, vibrational noise, etc. Although, tools that protect AFM against external noise have been developed and are widely used, there are still manysources of inherent noise. One of them is selfheating of the apparatus. This paper deals with self{heating of the AFM using an optical lever. This phenomenon is shown to be substantial in particular after activation of the microscope. The inluence on the intrinsic contact noise of AFM's is also examined.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JB - Sensors, detecting elements, measurement and regulation

OECD FORD branch

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Project

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Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2010

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Acta Polytechnica

ISSN

1210-2709

e-ISSN

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Volume of the periodical

20

Issue of the periodical within the volume

1

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

3

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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