Selecting Sinewave Test Frequencies for Dynamic ADC Tests
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00169462" target="_blank" >RIV/68407700:21230/10:00169462 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Selecting Sinewave Test Frequencies for Dynamic ADC Tests
Original language description
The precise selection of the input and sampling frequencies, and selection of the record length are very important for dynamic testing of AD converters and modules by sine wave signal. IEEE Std 1241-2000 [1] and Std 1057-2007 [2] provide standardizationin the ADC testing. Selection of optimal input testing signal frequency under these standards is resolved separately for applied deterministic testing methods. To compare results between each test method, it is necessary to use identical test conditionsinclusive of identical input testing signal frequency. That is why an algorithm of input testing signal frequency selection was developed to allow both the sine-fit and the DFT methods to be applied.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
IMEKO Symposium TC-4, TC-19 & IWADC Instrumentation for the ICT Area
ISBN
978-80-553-0424-3
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
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Publisher name
Technical University of Košice
Place of publication
Košice
Event location
Košice
Event date
Sep 8, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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