New Method Suitable for Relative Short Distance Measurement
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00170300" target="_blank" >RIV/68407700:21230/10:00170300 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
New Method Suitable for Relative Short Distance Measurement
Original language description
A new method for relative short distance measurement of reflective surfaces was designed. The relative distance is derived from a frequency where two interfering coherent signals (one is reflected from the measured object, the second is a reference one)create a sharp signal minimum. The viability of the method was preliminary experimentally verified in X-band. Potential possibilities of the method were tested by software simulation. Sub-micron distance resolution in industrial applications can be supposed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
European Microwave Week 2010 "Connecting the World" Conference Proceedings
ISBN
978-1-4244-7232-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
Horizon House Publications
Place of publication
London
Event location
Paříž
Event date
Sep 26, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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