Complex permittivity measurement of substrates using ring resonator
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00170787" target="_blank" >RIV/68407700:21230/10:00170787 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Complex permittivity measurement of substrates using ring resonator
Original language description
This paper deals with a complex permittivity measurement of dielectric substrates for planar circuits using ring resonator. This method is based on measurement of transmission and reflection coefficients of a transmission-type ring resonator with capacity coupling. Dielectric constant and the dissipation factor can be measured at wide frequency band by adjusting base resonant frequency of a ring resonator. Required parameters could be simply calculated according to information in this paper.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Technical Computing Bratislava 2010
ISBN
978-80-970519-0-7
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
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Publisher name
RT systems, s.r.o
Place of publication
Bratislava
Event location
Bratislava
Event date
Oct 20, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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