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The Ontology based FMEA of Lead Free Soldering Process

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00171596" target="_blank" >RIV/68407700:21230/10:00171596 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5547322" target="_blank" >http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5547322</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2010.5547322" target="_blank" >10.1109/ISSE.2010.5547322</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    The Ontology based FMEA of Lead Free Soldering Process

  • Original language description

    Paper is directed to improvement of a FMEA (Failure Mode and Effects Analysis) procedure in the area of reflow lead free soldering by the use of an ontology paradigm. Some ontology editor tools suitable for our intention are discussed. Particular phasesof ontology utilization for development of more exact approach to the FMEA procedure of reflow lead free soldering are analyzed. The goal of our work, a proposal of a user's guide for the FMEA procedure based on an ontology paradigm is presented. This user's guide is included in our university courses Management of Production Quality and Complex Quality Control provided by the Department of Electrotechnology of our faculty.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    33rd International Spring Seminar on Electronics Technology

  • ISBN

    978-1-4244-7849-1

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    360-364

  • Publisher name

    IEEE

  • Place of publication

    New York

  • Event location

    Warsaw

  • Event date

    May 12, 2010

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article