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Calculation of Maximal Applicable Gain for the Generalized and the Direct Method for Extreme Impedances Measurement

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00172412" target="_blank" >RIV/68407700:21230/10:00172412 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Calculation of Maximal Applicable Gain for the Generalized and the Direct Method for Extreme Impedances Measurement

  • Original language description

    A mathematical approach for determining the maximal applicable gain of amplifiers, that are used in two recently introduced methods for measurement of extreme input impedances using a common vector network analyzer (VNA) ? the generalized method and thedirect method ? is presented. These two measurement methods exhibit outstanding measurement sensitivity for extreme impedance values ? impedances significantly higher or lower than the 50Ů reference impedance of common measurement systems. The measurement sensitivity is better when gain of the used amplifiers is higher. However, the gain is limited by nonlinearity of the amplifiers and the receivers of the vector network analyzer. Therefore, the gain calculation is derived to make possible to fully exploit the capabilities of the measurement methods without loosing accuracy due to nonlinear effects. An example of calculation for one experimental setup is also presented.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    76th ARFTG Microwave Measurement Conference

  • ISBN

    978-1-4244-7448-6

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

  • Publisher name

    IEEE Microwave Theory and Techniques Society, US

  • Place of publication

    Piscataway

  • Event location

    Clearwater Beach, Florida

  • Event date

    Nov 30, 2010

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article