Using of Pulse Signal Sinx/x for DAC Testing
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F11%3A00181330" target="_blank" >RIV/68407700:21230/11:00181330 - isvavai.cz</a>
Result on the web
<a href="http://www.iwadc2011.diei.unipg.it/IWADC2011.html" target="_blank" >http://www.iwadc2011.diei.unipg.it/IWADC2011.html</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Using of Pulse Signal Sinx/x for DAC Testing
Original language description
In this paper the qualities of short methods for testing dynamical parameters internal ADCs and DACs with impulses Multi-Tone and Sinx/x signal are analyzed. Practically examples are compared with standard Single-Tone Fourier Transform Test Method. Thismethods finds an application in the industry in less demanding economical short testing.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
IMEKO TC4 International Workshop on ADC Modelling, Testing and Data Converter Analysis and Design
ISBN
978-1-61839-279-4
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
217-220
Publisher name
Universita degli Studi di Perugia
Place of publication
Perugia
Event location
Orvieto
Event date
Jun 30, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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