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Accurate Procedures of the Sparse-Matrix Deflation for Circuit Pole-Zero Analysis

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F11%3A00183907" target="_blank" >RIV/68407700:21230/11:00183907 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Accurate Procedures of the Sparse-Matrix Deflation for Circuit Pole-Zero Analysis

  • Original language description

    The pole-zero analysis is generally known to be very sensitive to the numerical precision of the computer arithmetic. In the paper, various methods are suggested for solving that problem. First, an optimal pivoting strategy of the algorithm that reducesthe general eigenvalue problem to the standard one is presented for both full- and sparse-matrix procedures. The algorithm increases the precision of the semisymbolic analysis. A new technique has also been incorporated recognizing multiple poles or zeros, which are often computed inaccurately by the standard algorithms. A novel type of this procedure called secondary root polishing is described in a detailed way. The accuracy is further increased using longer numerical data. First, the long double precision is utilized. Furthermore, a novel application of a suitable multiple-precision arithmetic library is suggested. Finally, using the longer numerical data to eliminate possible imprecision of the multiple eigenvalues is evaluated.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GAP102%2F10%2F1665" target="_blank" >GAP102/10/1665: Symbolic and Semisymbolic Methods for Power and Mechatronic Applications</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    IEEE Africon 2011

  • ISBN

    978-1-61284-993-5

  • ISSN

    2153-0025

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    1-6

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Livingstone

  • Event date

    Sep 13, 2011

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article