Microwave interferometric method for metal sheet thickness measurement

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F13%3A00213246" target="_blank" >RIV/68407700:21230/13:00213246 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/ARFTG.2013.6579036" target="_blank" >http://dx.doi.org/10.1109/ARFTG.2013.6579036</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ARFTG.2013.6579036" target="_blank" >10.1109/ARFTG.2013.6579036</a>

Result language
angličtina
Original language name
Microwave interferometric method for metal sheet thickness measurement
Original language description
A new microwave method capable of contactless thickness measurement of metal sheets with high resolution has been proposed. First experimental results in X-band are reported. The method is based on precise interferometric phase evaluation of a signal reflected step by step from two surfaces of a metal sheet whose thickness is to be measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected.
Czech name
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Czech description
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Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
81st ARFTG Microwave Measurement Conference Proceedings
ISBN
978-1-4673-4982-6
ISSN
—
e-ISSN
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Number of pages
3
Pages from-to
126-128
Publisher name
IEEE
Place of publication
New Jersey
Event location
Seattle
Event date
Jun 3, 2013
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000333388300017

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