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Influence of Input Terrain Profile Resolution on Diffraction Modeling

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F15%3A00230223" target="_blank" >RIV/68407700:21230/15:00230223 - isvavai.cz</a>

  • Alternative codes found

    RIV/00177016:_____/15:#0001053

  • Result on the web

    <a href="http://dx.doi.org/10.1109/LAWP.2015.2403867" target="_blank" >http://dx.doi.org/10.1109/LAWP.2015.2403867</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/LAWP.2015.2403867" target="_blank" >10.1109/LAWP.2015.2403867</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Influence of Input Terrain Profile Resolution on Diffraction Modeling

  • Original language description

    Tests using three selected terrain diffraction models, three available experimental datasets and three digital elevation products with different horizontal and vertical resolutions were carried out to assess the role of input terrain profile in diffraction modeling. It is demonstrated that low-resolution terrain maps are not, generally speaking, suitable for terrain diffraction modeling. Further, it is also shown that utilizing digital elevation products with medium spatial resolution results in predictions close to the case when high-resolution terrain maps are considered. Index Terms?Digital elevation products, modeling, propagation,

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    IEEE Antennas and Wireless Propagation Letters

  • ISSN

    1536-1225

  • e-ISSN

  • Volume of the periodical

    13

  • Issue of the periodical within the volume

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    4

  • Pages from-to

    1318-1321

  • UT code for WoS article

    000356001700007

  • EID of the result in the Scopus database

    2-s2.0-84933046367