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Supervised Segmentation of Microelectrode Recording Artifacts Using Power Spectral Density

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F15%3A00233642" target="_blank" >RIV/68407700:21230/15:00233642 - isvavai.cz</a>

  • Result on the web

    <a href="http://emb.citengine.com/event/embc-2015/paper-details?pdID=4502" target="_blank" >http://emb.citengine.com/event/embc-2015/paper-details?pdID=4502</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/EMBC.2015.7318661" target="_blank" >10.1109/EMBC.2015.7318661</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Supervised Segmentation of Microelectrode Recording Artifacts Using Power Spectral Density

  • Original language description

    Appropriate detection of clean signal segments in extracellular microelectrode recordings (MER) is vital for maintaining high signal-to-noise ratio in MER studies. Existing alternatives to manual signal inspection are based on unsupervised change-point detection. We present a method of supervised MER artifact classification, based on power spectral density (PSD) and evaluate its performance on a database of 95 labelled MER signals. The proposed method yielded test-set accuracy of 90%, which was close tothe accuracy of annotation (94%). The unsupervised methods achieved accuracy of about 77% on both training and testing data.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    IEEE EMBC 2015 Proceedings (Milano)

  • ISBN

    9781424492718

  • ISSN

    1557-170X

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    1524-1527

  • Publisher name

    IEEE

  • Place of publication

    Milano

  • Event location

    Milano

  • Event date

    Aug 25, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article