Extraction of Essential Solar Cell Parameters of Subcells in a Tandem Structure With a Novel Three-Terminal Measurement Technique

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F18%3A00321856" target="_blank" >RIV/68407700:21230/18:00321856 - isvavai.cz</a>

Result on the web

<a href="https://ieeexplore.ieee.org/document/8096993/" target="_blank" >https://ieeexplore.ieee.org/document/8096993/</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/JPHOTOV.2017.2762596" target="_blank" >10.1109/JPHOTOV.2017.2762596</a>

Result language

angličtina

Original language name

Extraction of Essential Solar Cell Parameters of Subcells in a Tandem Structure With a Novel Three-Terminal Measurement Technique

Original language description

Detailed understanding of the device electrical parameters based on the solar cell diode model is important for the optimization of the material and device structure to achieve higher efficiency. This paper discusses a method to extract subcell parameters in a tandem structure in a direct and simultaneous manner. A three-terminal analysis was done on a GaAsP/SiGe tandem solar cell grown on a Si substrate. The method has been proven to work on a monolithically grown cell where a middle contact is possible. The middle contact is used to measure the voltage between the two cells and therefore allowing calculation of the voltage of the individual cells. Circuit simulation demonstrates the validity of the measurement method as well as the calculation formula relating subcells parameters to the overall tandem performance. The resulting current-voltage curves allow calculation of essential solar cell parameters of each subcell, such as dark saturation current, ideality factor, and shunt and series resistances. Moreover, the current limiting cell under different illumination spectra can be accurately identified, which affects the overall power performance depending on the different subcell current-voltage characteristics. This paper focuses on the use of a three-terminal device for characterization purposes.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

20201 - Electrical and electronic engineering

Project

—

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

IEEE Journal of Photovoltaics

ISSN

2156-3381

e-ISSN

—

Volume of the periodical

8

Issue of the periodical within the volume

1

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

327-332

UT code for WoS article

000418770300048

EID of the result in the Scopus database

2-s2.0-85034443778