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New Variant of a Negative 4-phase Charge Pump

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F18%3A00325275" target="_blank" >RIV/68407700:21230/18:00325275 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    New Variant of a Negative 4-phase Charge Pump

  • Original language description

    Charge pump (CP) is a micropower alternative to conventional DC/DC converters. CPs have a small size and an easier integrability than conventional DC/DC converters. Nowadays, CPs became an integral part of low-voltage integrated circuits that contain some blocks with specific voltages. An example is non-volatile memories (Flash) that use programming voltage a greater than 10 V, but these circuits use power supply voltage about 1 V. Thus, these systems must integrate a positive CP that increases power supply voltage to an appropriate programming voltage. Required voltage gain of a CP can be decreased with a usage of modified programming scheme [1] that is based on negative bias. This paper is concentrated on a new concept of negative CP and comparison of this new concept with standard Dickson Charge Pump (DCP). The key parameters as voltage gain, rise time, number of elements, chip area and efficiency are compared by simulations executed by Mentor Graphics.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proc. of 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

  • ISBN

    978-1-5386-5755-3

  • ISSN

  • e-ISSN

    2473-2117

  • Number of pages

    300

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    Piscataway, NJ

  • Event location

    Budapest

  • Event date

    Apr 25, 2018

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article