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Partial Discharges Activity within an Internal Void at AC Voltage Disturbed by High Frequency Components

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F18%3A00326676" target="_blank" >RIV/68407700:21230/18:00326676 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1109/ICHVE.2018.8642238" target="_blank" >http://dx.doi.org/10.1109/ICHVE.2018.8642238</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ICHVE.2018.8642238" target="_blank" >10.1109/ICHVE.2018.8642238</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Partial Discharges Activity within an Internal Void at AC Voltage Disturbed by High Frequency Components

  • Original language description

    Frequent use of power electronics in electrical power systems imposes significant impulse and harmonic voltage stresses on various insulation systems. These systems are stressed by very fast and repetitive voltage distortions, which are superimposed on the power frequency voltage. The lifetime of an insulation system is influenced by partial discharge (PD) activity that is a consequence of long-term stresses or manufacturing imperfections. It has been proven that the intensity of PDs significantly depends on the operating voltage waveform. The paper deals with the experimental measurement of PDs on the physical model of an internal void in a solid dielectric under above mentioned voltage stress conditions. Gathered patterns and parameters of PDs were analyzed and evaluated to determine whether there exists any influence of higher harmonics content on the lifetime of the insulation system. The presented results show that the presence of high frequency oscillations on power frequency voltage have the impact on the PD activity. These findings can be significant for insulation lifetime assessment in the power systems containing power electronic devices.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of 2018 IEEE International Conference on High Voltage Engineering and Application

  • ISBN

    978-1-5386-5086-8

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE (Institute of Electrical and Electronics Engineers)

  • Place of publication

  • Event location

    Divani Caravel Hotel,Athens

  • Event date

    Sep 10, 2018

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000462278900339