Analysis of Changes Due to Long-Term Thermal Aging in Capacitors Manufactured from Polypropylene Film
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F20%3A00371974" target="_blank" >RIV/68407700:21230/20:00371974 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1109/ISSE49702.2020.9121021" target="_blank" >https://doi.org/10.1109/ISSE49702.2020.9121021</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ISSE49702.2020.9121021" target="_blank" >10.1109/ISSE49702.2020.9121021</a>
Alternative languages
Result language
angličtina
Original language name
Analysis of Changes Due to Long-Term Thermal Aging in Capacitors Manufactured from Polypropylene Film
Original language description
It has been found that the long-term thermal aging at the temperature of 100 oC and relative humidity 54 %, causes a low change of the capacitance and a high change of the loss factor of polypropylene (PP) film capacitors. The goal of the work has been to find main reasons of these changes. Dismounting of aged capacitors has shown that the metal layers on the PP film, which form the capacitor electrodes, near the metal contacts on the ends of the body of the capacitor are strongly corroded and sometimes even totally absent. On the other hand, the change of the total electrodes area is not significant, because the capacitance decreases only slightly during the thermal aging. A significant increase in the loss factor must be the increase the resistance of the metal layers that form the capacitor electrodes.
Czech name
—
Czech description
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Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2020 43rd International Spring Seminar on Electronics Technology (ISSE)
ISBN
978-1-7281-6773-2
ISSN
2161-2536
e-ISSN
2161-2528
Number of pages
5
Pages from-to
—
Publisher name
IEEE Press
Place of publication
New York
Event location
Demanovska Valley
Event date
May 14, 2020
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000610543500043