AFM-IN-SEM ANALYSES OF THIORPHAN ASSEMBLY ON ZNO POLAR AND NONPOLAR SURFACES
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F24%3A00377645" target="_blank" >RIV/68407700:21230/24:00377645 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.37904/nanocon.2023.4761" target="_blank" >https://doi.org/10.37904/nanocon.2023.4761</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.37904/nanocon.2023.4761" target="_blank" >10.37904/nanocon.2023.4761</a>
Alternative languages
Result language
angličtina
Original language name
AFM-IN-SEM ANALYSES OF THIORPHAN ASSEMBLY ON ZNO POLAR AND NONPOLAR SURFACES
Original language description
Despite the importance of thiorphan as a small molecule with vital biological roles, its interactions with zinc oxide (ZnO) nanomaterials that are prospective in drug delivery and theranostic applications have not yet been sufficiently explored. Here the impact of surface polarity of different ZnO surfaces on thiorphan adsorption is studied experimentally by combined in-situ scanning electron microscope (SEM) and atomic force microscope (AFM). Polar ZnO surfaces cause formation of thiorphan nanodots ( 4 nm or 25 nm), where the size of the nanodots depends on the direction of the surface dipoles. Nonpolar ZnO surfaces cause self-assembly of thiorphan into nanoislands and nanolayers with characteristic 4 nm layer thickness. AFM-in-SEM data shows clear correlation between secondary electron intensity of molecules in SEM and their height in AFM on polar ZnO surface whereas anti-correlation is observed on nonpolar ZnO surface. The secondary electron emission from the same molecule thus depends on its orientation, structure it assembles into and it can be controlled by direction of the substrate surface dipole.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
20501 - Materials engineering
Result continuities
Project
<a href="/en/project/TM03000033" target="_blank" >TM03000033: TACOM - Development of correlative AFM and SEM/AirSEM microscope</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
NANOCON 2023 Conference Proceedings
ISBN
978-80-88365-15-0
ISSN
2694-930X
e-ISSN
—
Number of pages
8
Pages from-to
360-367
Publisher name
TANGER
Place of publication
Ostrava
Event location
Brno
Event date
Oct 18, 2023
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
001234125400057