Plasmonic edge in graphene on hexagonal boron nitride flakes: AFM-in-SEM analysis of enhanced electron emission
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F24%3A00380029" target="_blank" >RIV/68407700:21230/24:00380029 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.5281/zenodo.14735335" target="_blank" >https://doi.org/10.5281/zenodo.14735335</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Plasmonic edge in graphene on hexagonal boron nitride flakes: AFM-in-SEM analysis of enhanced electron emission
Original language description
Application note about methodology of AFM-in-SEM microscopy for analysis of enhanced electron emission due to visible frequency plasmonic effect in graphene at the edge of hexagonal boron nitride flakes.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/TM03000033" target="_blank" >TM03000033: TACOM - Development of correlative AFM and SEM/AirSEM microscope</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů