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Alternative Method of A/D Conversion Quality Verification

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F99%3A03019033" target="_blank" >RIV/68407700:21230/99:03019033 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Alternative Method of A/D Conversion Quality Verification

  • Original language description

    Well known methods for testing ADC dynamic quality require low-distortion generator and it can be a problem by testing high-resolution ADCs, same as middle resolution high-speed ADCs. The paper describes new alternative method - Spectrum Correction Test.It is based on the FFT test, but the distortion of a testing signal is corrected. The basic idea is the fact, that the Fourier Transform is a linear operation. Therefore it is possible to recognize spectral lines, which belong to the generator used and the lines of the ADC. The spectrum measured on the ADC's output can be corrected for the known spectrum of the generator. A PC simulation was executed to investigate, if this method could be used. Than the system for evaluation of the test was designed and realised. The first experience and achieved results are also published in this paper.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    1999

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    IMTC/99 Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference

  • ISBN

    0-7803-5276-9

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    Piscataway, NJ

  • Event location

  • Event date

  • Type of event by nationality

  • UT code for WoS article